João Paulo Cacho Teixeira
AuthID: R-000-7A4
151
TITLE: Self-checking and fault tolerance quality assessment using Fault Sampling
AUTHORS: Goncalves, FM; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2002, SOURCE: 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems in 17TH IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS, VOLUME: 2002-January
AUTHORS: Goncalves, FM; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2002, SOURCE: 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems in 17TH IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS, VOLUME: 2002-January
152
TITLE: Optimizing functional distribution in complex system design
AUTHORS: Dias, OP; Teixeira, IM; Teixeira, JP; Becker, LB; Pereira, CE;
PUBLISHED: 2001, SOURCE: IFIP WG10 3/WG10 4/WG10 5 International Workshop on Distributed and Parallel Embedded Systems (DIPES 2000) in ARCHITECTURE AND DESIGN OF DISTRIBUTED EMBEDDED SYSTEMS, VOLUME: 61
AUTHORS: Dias, OP; Teixeira, IM; Teixeira, JP; Becker, LB; Pereira, CE;
PUBLISHED: 2001, SOURCE: IFIP WG10 3/WG10 4/WG10 5 International Workshop on Distributed and Parallel Embedded Systems (DIPES 2000) in ARCHITECTURE AND DESIGN OF DISTRIBUTED EMBEDDED SYSTEMS, VOLUME: 61
INDEXED IN: 
Scopus 
WOS
Scopus WOS153
TITLE: RTL design validation, DFT and test pattern generation for high defects coverage
AUTHORS: Santos, MB; Goncalves, FM; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2001, SOURCE: IEEE European Test Workshop (ETW 01) in ETW 2001: IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
AUTHORS: Santos, MB; Goncalves, FM; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2001, SOURCE: IEEE European Test Workshop (ETW 01) in ETW 2001: IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
INDEXED IN: WOS
WOS154
TITLE: Design and test of certifiable ASICs for safety-critical gas burners control
AUTHORS: Goncalves, FM; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2001, SOURCE: 7th IEEE International On-Line Testing Workshop in SEVENTH IEEE INTERNATIONAL ON-LINE TESTING WORKSHOP, PROCEEDINGS
AUTHORS: Goncalves, FM; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2001, SOURCE: 7th IEEE International On-Line Testing Workshop in SEVENTH IEEE INTERNATIONAL ON-LINE TESTING WORKSHOP, PROCEEDINGS
INDEXED IN: WOS
WOS155
TITLE: Test resource partitioning: a design & test issue
AUTHORS: Teixeira, JP; Teixeira, IM; Pereira, CE; Dias, OP; Jorge Semião ;
PUBLISHED: 2001, SOURCE: Design, Automation and Test in Europe Conference and Exhibition (DATE 2001) in DESIGN, AUTOMATION AND TEST IN EUROPE, CONFERENCE AND EXHIBITION 2001, PROCEEDINGS
AUTHORS: Teixeira, JP; Teixeira, IM; Pereira, CE; Dias, OP; Jorge Semião ;
PUBLISHED: 2001, SOURCE: Design, Automation and Test in Europe Conference and Exhibition (DATE 2001) in DESIGN, AUTOMATION AND TEST IN EUROPE, CONFERENCE AND EXHIBITION 2001, PROCEEDINGS
156
TITLE: Towards e-management as enabler for accelerated change
AUTHORS: Lérias, H; Luz, J; Moura, P; Mendes, A; Teixeira, I; Teixeira, JP;
PUBLISHED: 2001, SOURCE: 3rd International Conference on Enterprise Information Systems, ICEIS 2001 in ICEIS 2001 - Proceedings of the 3rd International Conference on Enterprise Information Systems, VOLUME: 2
AUTHORS: Lérias, H; Luz, J; Moura, P; Mendes, A; Teixeira, I; Teixeira, JP;
PUBLISHED: 2001, SOURCE: 3rd International Conference on Enterprise Information Systems, ICEIS 2001 in ICEIS 2001 - Proceedings of the 3rd International Conference on Enterprise Information Systems, VOLUME: 2
INDEXED IN: Scopus
Scopus157
TITLE: RTL-based functional test generation for high defects coverage in digital SOCs
AUTHORS: Santos, MB; Goncalves, FM; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2000, SOURCE: IEEE European Test Workshop in IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
AUTHORS: Santos, MB; Goncalves, FM; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2000, SOURCE: IEEE European Test Workshop in IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
INDEXED IN: WOS
WOS158
TITLE: MOSYS: A methodology for automatic object identification from system specification
AUTHORS: Becker, LB; Pereira, CE; Dias, OP; Teixeira, IM; Teixeira, JP;
PUBLISHED: 2000, SOURCE: 3rd IEEE International Symposium on Object-Oriented Real-Time Distributed Computing, ISORC 2000 in Proceedings - 3rd IEEE International Symposium on Object-Oriented Real-Time Distributed Computing, ISORC 2000
AUTHORS: Becker, LB; Pereira, CE; Dias, OP; Teixeira, IM; Teixeira, JP;
PUBLISHED: 2000, SOURCE: 3rd IEEE International Symposium on Object-Oriented Real-Time Distributed Computing, ISORC 2000 in Proceedings - 3rd IEEE International Symposium on Object-Oriented Real-Time Distributed Computing, ISORC 2000
INDEXED IN: Scopus 
CrossRef
Scopus CrossRef159
TITLE: Metrics and criteria for quality assessment of testable Hw Sw systems architectures Full Text
AUTHORS: Dias, OP; Teixeira, IC ; Teixeira, JP;
PUBLISHED: 1999, SOURCE: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, VOLUME: 14, ISSUE: 1-2
AUTHORS: Dias, OP; Teixeira, IC ; Teixeira, JP;
PUBLISHED: 1999, SOURCE: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, VOLUME: 14, ISSUE: 1-2
160
TITLE: Testability issues in the CMS ECAL upper-level readout and trigger system
AUTHORS: Almeida, CB; Teixeira, IC; Teixeira, JP; Varela, J; Augusto, J ; Santos, M; Cardoso, N;
PUBLISHED: 1999, SOURCE: 5th Workshop on Electronics for LHC Experiments in PROCEEDINGS OF THE FIFTH WORKSHOP ON ELECTRONICS FOR LHC EXPERIMENTS
AUTHORS: Almeida, CB; Teixeira, IC; Teixeira, JP; Varela, J; Augusto, J ; Santos, M; Cardoso, N;
PUBLISHED: 1999, SOURCE: 5th Workshop on Electronics for LHC Experiments in PROCEEDINGS OF THE FIFTH WORKSHOP ON ELECTRONICS FOR LHC EXPERIMENTS
INDEXED IN: WOS
WOS