An Enhanced Smart Sampling Algorithm Based on Deep Learning

AuthID
 P-00Y-V4X
6
Author(s)
Carratu, M
·
Dello Iacono, S
·
Gallo, V
·
Paciello, V
·
Monte, G
·
Document Type
Proceedings Paper
Year published
2023
Published
in 2023 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, I2MTC in IEEE Instrumentation and Measurement Technology Conference, ISSN: 1091-5281
Volume: 2023-May
Conference
Ieee International Instrumentation and Measurement Technology Conference (I2Mtc) - Rising Above Covid-19, Date: MAY 22-25, 2023, Location: Kuala Lumpur, MALAYSIA
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Publication Identifiers
Scopus: 2-s2.0-85166381447
Wos: WOS:001039259600169
Source Identifiers
ISSN: 1091-5281
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