Mapping Nyf Pegmatite Outcrops Through High-Resolution Worldview-3 Imagery

AuthID
P-00Z-6NY
6
Author(s)
Santos, D
·
Mendes, A
·
Azzalini, A
·
3
Editor(s)
Schulz,K;Michel,U;Nikolakopoulos,KG
Document Type
Proceedings Paper
Year published
2023
Published
in Proceedings of SPIE - The International Society for Optical Engineering, ISSN: 0277-786X
Volume: 12734
Conference
Earth Resources and Environmental Remote Sensing/Gis Applications Xiv 2023, Date: 3 September 2023 through 6 September 2023, Location: Amsterdam
Indexing
Publication Identifiers
Scopus: 2-s2.0-85179546123
Source Identifiers
ISSN: 0277-786X
Export Publication Metadata
Marked List
Info
At this moment we don't have any links to full text documens.