Structural Study of Si1-Xgex Nanocrystals Embedded in Sio2 Films

AuthID
 P-003-92Q
9
Author(s)
Kashtiban, RJ
·
Buljan, M
·
Bangert, U
·
Document Type
Article
Year published
2010
Published
in THIN SOLID FILMS, ISSN: 0040-6090
Volume: 518, Issue: 9, Pages: 2569-2572 (4)
Conference
Symposium on Silicon and Germanium Issues for Future Cmos Devices Held at the 2009 E-Mrs Spring Meeting, Date: JUN 08-12, 2009, Location: Strasbourg, FRANCE, Sponsors: European Mat Res Soc
Indexing
Wos®
Scopus®
Crossref®
Google Scholar®
Publication Identifiers
Scopus: 2-s2.0-76249108880
Wos: WOS:000275615100064
Source Identifiers
ISSN: 0040-6090
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

A place for researchers and their institutions

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service