Photopeak Shift Effects Due to the Drift Electric Field in High Pressure Xenon Detectors

AuthID
P-003-DDW
Document Type
Proceedings Paper
Year published
2010
Published
in 2010 IEEE NUCLEAR SCIENCE SYMPOSIUM CONFERENCE RECORD (NSS/MIC) in IEEE Nuclear Science Symposium Conference Record, ISSN: 1082-3654
Pages: 1472-1473 (2)
Conference
Ieee Nuclear Science Symposium (Nss)/Medical Imaging Conference (Mic)/17Th International Workshop on Room-Temperature Semiconductor X-Ray and Gamma-Ray Detectors, Date: OCT 30-NOV 06, 2010, Location: Knoxville, TN, Sponsors: Inst Elect & Elect Engineers, Nucl & Plasma Sci Soc, IEEE
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Publication Identifiers
Scopus: 2-s2.0-79960298075
Wos: WOS:000306402901135
Source Identifiers
ISSN: 1082-3654
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