Effect of the Discharge Frequency and Impedance on the Structural Properties of Polymorphous Silicon

AuthID
 P-000-B6H
5
Author(s)
Raniero, L
·
1
Editor(s)
Brabec C.Jaeger-Waldau A.Poortmans J.Slaoui A.
Document Type
Article
Year published
2004
Published
in THIN SOLID FILMS, ISSN: 0040-6090
Volume: 451, Pages: 264-268 (5)
Conference
Symposium on Thin Film and Nono-Structured Materials for Photovoltaics, Date: JUN, 2003, Location: Strasbourg, FRANCE
Indexing
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Scopus®
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Publication Identifiers
Scopus: 2-s2.0-1442335821
Wos: WOS:000220510500057
Source Identifiers
ISSN: 0040-6090
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