Gate-Bias Stress in Amorphous Oxide Semiconductors Thin-Film Transistors

AuthID
 P-003-GSS
8
Author(s)
Document Type
Article
Year published
2009
Published
in APPLIED PHYSICS LETTERS, ISSN: 0003-6951
Volume: 95, Issue: 6, Pages: 063502 (3)
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Wos®
Scopus®
Crossref®161
Google Scholar®
Publication Identifiers
Scopus: 2-s2.0-69049119241
Wos: WOS:000269060600070
Source Identifiers
ISSN: 0003-6951
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