Dilatometer for Characterization of Thermal Expansion of Ceramic Samples

AuthID
P-003-QF2
Document Type
Proceedings Paper
Year published
2009
Published
in IECON: 2009 35TH ANNUAL CONFERENCE OF IEEE INDUSTRIAL ELECTRONICS, VOLS 1-6
Pages: 1740-1745 (6)
Conference
35Th Annual Conference of the Ieee-Industrial-Electronics-Society (Iecon 2009), Date: NOV 03-05, 2009, Location: Porto, PORTUGAL, Sponsors: IEEE Ind Elect Soc
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Scopus: 2-s2.0-77951608407
Wos: WOS:000280762000294
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