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Charging Effects in Cdse Nanocrystals Embedded in Sio2 Matrix Produced by Rf Magnetron Sputtering
AuthID
P-003-TNZ
9
Author(s)
Levichev, S
·
Chahboun, A
·
Basa, P
·
Rolo, AG
·
Barradas, NP
·
Alves, E
·
Horvath, ZJ
·
Conde, O
·
Gomes, MJM
Document Type
Article
Year published
2008
Published
in
MICROELECTRONIC ENGINEERING,
ISSN: 0167-9317
Volume: 85, Issue: 12, Pages: 2374-2377 (4)
Conference
Symposium on Materials and Emerging Technologies for Non-Volatile-Memory Devices Held at the 2008 Emrs Spring Meeting,
Date:
MAY 26-30, 2008,
Location:
Strasbourg, FRANCE,
Sponsors:
European Mat Res Soc
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Publication Identifiers
DOI
:
10.1016/j.mee.2008.09.003
Handle
:
https://hdl.handle.net/1822/16468
Scopus
: 2-s2.0-56649106475
Wos
: WOS:000262460600013
Source Identifiers
ISSN
: 0167-9317
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