Publications

Spatially-Resolved Photocapacitance Measurements to Study Defects in A-Si : H Based P-I-N Particle Detectors

AuthID
P-003-YKJ

Author(s)

Casteleiro, C

Wuensch, F

Kunst, M

Morgado, E

Stallinga, P

Gomes, HL

Document Type

Article

Year published

2008

Published

in THIN SOLID FILMS, ISSN: 0040-6090

Volume: 516, Issue: 15, Pages: 5118-5121 (4)

Indexing

Wos^®

Scopus^®

Crossref^®

Google Scholar^®

Publication Identifiers

DOI: 10.1016/j.tsf.2008.01.012

Scopus: 2-s2.0-43049086627

Wos: WOS:000256509100075

Source Identifiers

ISSN: 0040-6090

Export Publication Metadata

Marked List

Add to Marked List

Citations

Oops! It looks like you don't have access to this content.

This section is restricted to uses with b-on access.

CORE Conference

No information about CORE Rank

During the preprocessing phase, only publications of type 'Proceedings Paper' or 'Proceedings' are automatically processed to identify their CORE Rank.

TIP: If your publication's CORE Rank is missing, you can contact with your institutional manager to have the correct ranking manually added to the record.

Journal Factors

Oops! It looks like you don't have access to this content.

This section is restricted to uses with b-on access.

Full Text

Full Text @ sfx.b-on.pt

Spatially-Resolved Photocapacitance Measurements to Study Defects in A-Si : H Based P-I-N Particle Detectors

Useful Links

Get Help

Federated Authentication (Click on the image)

Spatially-Resolved Photocapacitance Measurements to Study Defects in A-Si : H Based P-I-N Particle Detectors

Useful Links

Get Help