Effects of Temperature on the Fracture Response of Emc-Si Interface Found in Multilayer Semiconductor Components

AuthID
P-017-T63
8
Author(s)
Valdoleiros, J
·
Akhavan-Safar, A
·
Maleki, P
·
Videira, PFC
·
Marques, EAS
·
Karunamurthy, B
·
Document Type
Article
Year published
2025
Published
in SURFACES, ISSN: 2571-9637
Volume: 8, Issue: 1, Pages: 2 (19)
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Publication Identifiers
Scopus: 2-s2.0-105001276582
Wos: WOS:001453861800001
Source Identifiers
ISSN: 2571-9637
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