Relaxation Digital-To-Analog Converters Featuring Self-Calibration and Parasitics-Induced Error Suppression in 180-Nm Cmos

AuthID
P-017-WA4
6
Author(s)
Rubino, R
·
Musolino, F
·
Toledo, P
·
Chen, Y
·
Richelli, A
·
Document Type
Article
Year published
2025
Published
in IEEE ACCESS, ISSN: 2169-3536
Volume: 13, Pages: 6594-6605 (12)
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Publication Identifiers
Scopus: 2-s2.0-85214908721
Wos: WOS:001397806100034
Source Identifiers
ISSN: 2169-3536
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