Characterization of Paint Layers by Simultaneous Self-Consistent Fitting of Rbs/Pixe Spectra Using Simulated Annealing

AuthID
 P-004-0NY
3
Author(s)
Beck, L
·
Document Type
Article
Year published
2008
Published
in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ISSN: 0168-583X
Volume: 266, Issue: 8, Pages: 1871-1874 (4)
Conference
18Th International Conference on Ion Beam Analysis, Date: SEP 23-28, 2007, Location: Hyderabad, INDIA, Sponsors: Inter Univ Accelerator Ctr, Inst Phys, Host: Univ Hyderabad, Sch Phys
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Publication Identifiers
Scopus: 2-s2.0-43149101030
Wos: WOS:000256677600146
Source Identifiers
ISSN: 0168-583X
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