in DELTA 2008: FOURTH IEEE INTERNATIONAL SYMPOSIUM ON ELECTRONIC DESIGN, TEST AND APPLICATIONS, PROCEEDINGS
Pages: 571-575 (5)
Conference
4Th Ieee International Symposium on Electronic Design, Test and Applications, Date: JAN 23-25, 2008, Location: Hong Kong, PEOPLES R CHINA, Sponsors: IEEE Comp Soc, TTTC, IEEE Hong Kong Sect, Hong Kong Univ Sci & Technol, Celoxica Ltd, Solomon Systech Ltd, Natl Instruments, Chinese Univ Hong Kong