Substrate Noise Analysis for Integrated Circuits Design

AuthID
 P-004-F1D
2
Author(s)
Document Type
Proceedings Paper
Year published
2007
Published
in 2007 IEEE INSTRUMENTATION & MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5 in IEEE Instrumentation and Measurement Technology Conference, ISSN: 1091-5281
Pages: 1999-2003 (5)
Conference
24Th Ieee Instrumentation and Measurement Technology Conference, Date: MAY 01-03, 2007, Location: Warsaw, POLAND, Sponsors: IEEE
Indexing
Wos®
Scopus®
Publication Identifiers
Scopus: 2-s2.0-34648833449
Wos: WOS:000251296802009
Source Identifiers
ISSN: 1091-5281
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