Thin-Film Field-Effect Transistors: The Effects of Traps on the Bias and Temperature Dependence of Field-Effect Mobility, Including the Meyer-Neldel Rule

AuthID
 P-004-FXJ
2
Author(s)
Document Type
Article
Year published
2006
Published
in ORGANIC ELECTRONICS, ISSN: 1566-1199
Volume: 7, Issue: 6, Pages: 592-599 (8)
Indexing
Wos®
Scopus®
Crossref®
Google Scholar®
Publication Identifiers
Scopus: 2-s2.0-33751018886
Wos: WOS:000242736700021
Source Identifiers
ISSN: 1566-1199
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

A place for researchers and their institutions

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service