Modeling Electrical Characteristics of Thin-Film Field-Effect Transistors Ii: Effects of Traps and Impurities

AuthID
 P-004-FZC
2
Author(s)
Document Type
Article
Year published
2006
Published
in SYNTHETIC METALS, ISSN: 0379-6779
Volume: 156, Issue: 21-24, Pages: 1316-1326 (11)
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Publication Identifiers
Scopus: 2-s2.0-33846644947
Wos: WOS:000244626600005
Source Identifiers
ISSN: 0379-6779
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