Oxide Muonics and the 3-Delta Model for Deep and Shallow Hydrogen States in Dielectric and Semiconducting Oxides

AuthID
 P-004-MK9
6
Author(s)
Cox, SFJ
·
Gavartin, JL
·
Lord, JS
·
Davis, EA
1
Editor(s)
Oshiyama A.Maeda K.Itoh K.M.Katayama-Yoshida H.
Document Type
Article
Year published
2006
Published
in PHYSICA B-CONDENSED MATTER, ISSN: 0921-4526
Volume: 376, Issue: 1, Pages: 385-388 (4)
Conference
23Rd International Conference on Defects in Semiconductors, Date: JUL 24-29, 2005, Location: Awaji Isl, JAPAN
Indexing
Wos®
Scopus®
Crossref®5
Google Scholar®
Publication Identifiers
Scopus: 2-s2.0-33645231668
Wos: WOS:000237329500096
Source Identifiers
ISSN: 0921-4526
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

A place for researchers and their institutions

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service