Non-Invasive Electrical Characterization of Semiconductor Interfaces

AuthID
 P-000-F5D
9
Author(s)
Vanderhaghen, R
·
Kasouit, S
·
Cho, HM
·
·
Lee, YW
·
Kim, HJ
·
Kim, SY
·
Kleider, JP
1
Editor(s)
Rosenwaks,Y
Document Type
Article
Year published
2003
Published
in MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, ISSN: 0921-5107
Volume: 102, Issue: 1-3, Pages: 156-160 (5)
Conference
Spring Meeting of the European-Materials-Research-Society (E-Mrs), Date: JUN 18-21, 2002, Location: STRASBOURG, FRANCE, Sponsors: European Mat Res Soc
Indexing
Wos®
Scopus®
Crossref®
Google Scholar®
Publication Identifiers
Scopus: 2-s2.0-0042012747
Wos: WOS:000185174800032
Source Identifiers
ISSN: 0921-5107
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

A place for researchers and their institutions

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service