Grace Ontology Integrating Process and Quality Control

AuthID
P-005-41Y
5
Author(s)
Document Type
Proceedings Paper
Year published
2012
Published
in 38TH ANNUAL CONFERENCE ON IEEE INDUSTRIAL ELECTRONICS SOCIETY (IECON 2012) in IEEE Industrial Electronics Society, ISSN: 1553-572X
Pages: 4348-4353 (6)
Conference
38Th Annual Conference on Ieee-Industrial-Electronics-Society (Iecon ), Date: OCT 25-28, 2012, Location: Montreal, CANADA, Sponsors: IEEE, IEEE Ind Elect Soc (IES), Host: Univ Quebec, Ecole Technologie Superieure Montreal (ETS)
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Publication Identifiers
Scopus: 2-s2.0-84872921006
Wos: WOS:000316962904048
Source Identifiers
ISSN: 1553-572X
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