A Mixed-Domain Behavioral Model's Extraction for Digital I/O Buffers

AuthID
P-005-K28
3
Author(s)
Document Type
Proceedings Paper
Year published
2012
Published
in 2012 IEEE 21ST CONFERENCE ON ELECTRICAL PERFORMANCE OF ELECTRONIC PACKAGING AND SYSTEMS in IEEE Conference on Electrical Performance of Electronic Packaging and Systems-EPEPS, ISSN: 2165-4107
Pages: 224-227 (4)
Conference
Ieee 21St Conference on Electrical Performance of Electronic Packaging and Systems (Epeps), Date: OCT 21-24, 2012, Location: Tempe, AZ, Sponsors: IEEE, IEEE Microwave Theory & Tech Soc, IEEE Components, Packaging & Mfg Technol Soc, Ansys Inc, Cadence Design Syst Inc, 3DIC Res Ctr, Agilent Technologies Inc, ASE Grp, E Syst Design Inc, IBM Res, IdemWorks s r l, Nimbic Inc
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Publication Identifiers
Scopus: 2-s2.0-84874498508
Wos: WOS:000323212000050
Source Identifiers
ISSN: 2165-4107
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