Fault Diagnosis Based on Black-Box Models with Application to a Liquid-Level System

AuthID
 P-000-JKD
3
Author(s)
Document Type
Proceedings Paper
Year published
2003
Published
in ETFA 2003: IEEE CONFERENCE ON EMERGING TECHNOLOGIES AND FACTORY AUTOMATION, VOL 2, PROCEEDINGS
Pages: 739-746 (8)
Conference
9Th Ieee International Conference on Emerging Technologies and Factory Automation, Date: SEP 16-19, 2003, Location: Lisbon, PORTUGAL, Sponsors: IEEE Ind Elect Soc, UNINOVA, Univ Nova Lisboa FCT DEE, Host: Calouste Gulbenkian Fdn
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Wos: WOS:000189414100111
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