Influence of Rf-Sputtering Power on Formation of Vertically Stacked Si1-Xgex Nanocrystals Between Ultra-Thin Amorphous Al2O3 Layers: Structural and Photoluminescence Properties

AuthID
P-006-780
15
Author(s)
Vieira, EMF
·
Martin Sanchez, J
·
Roldan, MA
·
Varela, M
·
Buljan, M
·
Bernstorff, S
·
Pennycook, SJ
·
Molina, SI
·
Document Type
Article
Year published
2013
Published
in JOURNAL OF PHYSICS D-APPLIED PHYSICS, ISSN: 0022-3727
Volume: 46, Issue: 38, Pages: 385301 (10)
Indexing
Publication Identifiers
Scopus: 2-s2.0-84885099900
Wos: WOS:000324099000011
Source Identifiers
ISSN: 0022-3727
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