Fault Modeling and Defect Level Projections in Digital Ics

AuthID
P-007-65A
4
Author(s)
Sousa, JT
·
Williams, TW
1
Editor(s)
Anon
Document Type
Proceedings Paper
Year published
1994
Published
in Proceedings of the European Design and Test Conference
Pages: 436-442
Conference
Proceedings of the European Design and Test Conference, Date: 28 February 1994 through 3 March 1994, Location: Paris, Fr, Sponsors: European Design Automation Association;AEIA, Spain;Altium, an IBM Company;Bull SA, France;IEEE Computer Society;et al
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Scopus: 2-s2.0-0028018589
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