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Ge Nanocrystals in Alumina Matrix: a Structural Study

AuthID
P-007-SW8

Author(s)

Kashtiban, RJ

Bangert, U

Harvey, AJ

Editor(s)

Walther, T; Nellist, PD; Hutchison, JL; Cullis, AG

Document Type

Proceedings Paper

Year published

2010

Published

in 16TH INTERNATIONAL CONFERENCE ON MICROSCOPY OF SEMICONDUCTING MATERIALS in Journal of Physics Conference Series, ISSN: 1742-6588

Volume: 209, Pages: 012060 (4)

Conference

16Th International Conference on Microscopy of Semiconducting Materials, Date: MAR 17-20, 2009, Location: Univ Oxford, Oxford, ENGLAND, Sponsors: Royal Microscop Soc, Host: Univ Oxford

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Metadata
Sources

Publication Identifiers

DOI: 10.1088/1742-6596/209/1/012060

Scopus: 2-s2.0-77950498755

Wos: WOS:000283739100060

Source Identifiers

ISSN: 1742-6588

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