Cluster Validation Using a Probabilistic Attributed Graph

AuthID
 P-007-VWY
2
Author(s)
Jain, AK
Document Type
Proceedings Paper
Year published
2008
Published
in Proceedings - International Conference on Pattern Recognition, ISSN: 1051-4651
Conference
2008 19Th International Conference on Pattern Recognition, Icpr 2008, Date: 8 December 2008 through 11 December 2008, Location: Tampa, FL
Indexing
Scopus®
Crossref®4
Google Scholar®
Publication Identifiers
Scopus: 2-s2.0-77957956277
Source Identifiers
ISSN: 1051-4651
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