Implanted Impurities in Wide Band Gap Semiconductors

AuthID
 P-007-Y6G
3
Author(s)
Kessler, P
·
Vianden, R
Document Type
Article
Year published
2011
Published
in Defect and Diffusion Forum, ISSN: 1012-0386
Volume: 311, Pages: 167-179
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Scopus®
Google Scholar®
Publication Identifiers
Scopus: 2-s2.0-79955387003
Source Identifiers
ISSN: 1012-0386
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