Publications

An Epidemic Approach to Dependable Key-Value Substrates

AuthID
P-007-ZYR

Author(s)

Matos, M

Vilaca, R

Pereira, J

Oliveira, R

Document Type

Proceedings Paper

Year published

2011

Published

in Proceedings of the International Conference on Dependable Systems and Networks in DSN Workshops

Pages: 105-110

Conference

2011 Ieee/Ifip 41St International Conference on Dependable Systems and Networks Workshops, Dsn-W 2011, Date: 27 June 2011 through 30 June 2011, Location: Hong Kong, Sponsors: IEEE Comput. Soc. Tech. Comm. Dependable Comput.Fault Tolerance;IFIP Work. Group 10.4 Dependable Comput. Fault Tolerance

Indexing