Textural Evolution Evaluated by Ebsd and Xrd After Thermal Treatment in Ni-Ti Shape Memory Alloy

AuthID
 P-008-1T8
6
Author(s)
Ribeiro, SB
·
Andrade, TG
·
5
Editor(s)
Tewari, A; Suwas, S; Srivastava, D; Samajdar, I; Haldar, A
Document Type
Proceedings Paper
Year published
2012
Published
in TEXTURES OF MATERIALS, PTS 1 AND 2 in Materials Science Forum, ISSN: 0255-5476
Volume: 702-703, Pages: 884-887 (4)
Conference
16Th International Conference on the Textures of Materials (Icotom 16), Date: DEC 12-17, 2011, Location: Mumbai, INDIA, Sponsors: Bruker AXS, Icon analyt, FEI, Panalytical, Ametek, CAMECA, EDAX, Oxford Instruments, Bluestar, Jeol, Carl Zeiss, Gatan, Censico Int , Buehler, Dynam Syst Inc, Forevision Instruments, Hitachi, IR Tech, Rigaku, Vivid Technolog, Struers, BRNS, Dept Atom Energy, Dept Sci & Technol, Defense Res & Dev Org, Indian Inst Technol Bombay, Indian Inst Metals, Host: Indian Inst Technol Bombay
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Publication Identifiers
Scopus: 2-s2.0-84855406017
Wos: WOS:000308115000194
Source Identifiers
ISSN: 0255-5476
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