Integrated Silicon Microspectrometers

AuthID
 P-000-TD5
5
Author(s)
Kong, SH
·
de Graaf, G
·
Bartek, M
·
Wolffenbuttel, RF
Document Type
Article
Year published
2001
Published
in IEEE INSTRUMENTATION & MEASUREMENT MAGAZINE, ISSN: 1094-6969
Volume: 4, Issue: 3, Pages: 34-38 (5)
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Publication Identifiers
Scopus: 2-s2.0-0035450419
Wos: WOS:000170572100008
Source Identifiers
ISSN: 1094-6969
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