Methodology for Consideration of System Quality Within Manufacturing

AuthID
 P-008-DA3
6
Author(s)
Foehr, M
·
Jaeger, T
·
Petrali, P
·
Document Type
Proceedings Paper
Year published
2013
Published
in 2013 7TH ANNUAL IEEE INTERNATIONAL SYSTEMS CONFERENCE (SYSCON 2013)
Pages: 553-558 (6)
Conference
7Th Annual Ieee International Systems Conference (Syscon), Date: APR 15-18, 2013, Location: Orlando, FL, Sponsors: IEEE
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Scopus®
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Publication Identifiers
Scopus: 2-s2.0-84883025524
Wos: WOS:000326754400086
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