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Interaction Between Test Circuit for Generation of Secondary Arcs and Short-Circuit Test Transformer

AuthID
P-008-NPH

Author(s)

Martins, H

Ferreira, CDF

Cerqueira, W

Vasques, CM

Trindade, M

Document Type

Proceedings Paper

Year published

2010

Published

in 2010 International Conference on High Voltage Engineering and Application, ICHVE 2010

Pages: 361-364

Conference

2010 International Conference on High Voltage Engineering and Application, Ichve 2010, Date: 11 October 2010 through 14 October 2010, Location: New Orleans, LA

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Publication Identifiers

DOI: 10.1109/ichve.2010.5640753

Scopus: 2-s2.0-78650606949

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