Non Invasive Electrical Characterization of Semiconductor and Interface

AuthID
 P-008-XMK
6
Author(s)
Kasouit, S
·
Drevillon, B
·
Kim, HJ
·
Kleider, JP
·
Vanderhaghen, R
1
Editor(s)
Brown G.J.Razeghi M.
Document Type
Proceedings Paper
Year published
2002
Published
in Proceedings of SPIE - The International Society for Optical Engineering, ISSN: 0277-786X
Volume: 4650, Pages: 213-220
Conference
Photodetector Materials and Devices Vii, Date: 21 January 2002 through 23 January 2002, Location: San Jose, CA, Sponsors: SPIE
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Publication Identifiers
Scopus: 2-s2.0-0036060513
Source Identifiers
ISSN: 0277-786X
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