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Generating Reduced Order Models via Peec for Capturing Skin and Proximity Effects

AuthID
P-009-0J7

Author(s)

Kamon, M

Marques, N

Silveira, LM

White, J

Editor(s)

Anon

Document Type

Proceedings Paper

Year published

1997

Published

in ELECTRICAL PERFORMANCE OF ELECTRONIC PACKAGING

Pages: 259-262 (4)

Conference

6Th Topical Meeting on Electrical Performance of Electronic Packaging, Date: OCT 27-29, 1997, Location: SAN JOSE, CA, Sponsors: IEEE Microwave Theory & Tech Soc, IEEE Components Packaging & Mfg Technol Soc

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Publication Identifiers

DOI: 10.1109/epep.1997.634084

Scopus: 2-s2.0-0031335538

Wos: WOS:A1997BJ93U00058

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Generating Reduced Order Models via Peec for Capturing Skin and Proximity Effects

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