Thickness and Roughness Measurements in Poly(O-Methoxyaniline) Layer-By-Layer Films Using Afm

AuthID
 P-009-15J
5
Author(s)
Pereira da Silva, MA
·
Faria, RM
·
Oliveira, ON
Document Type
Article
Year published
1999
Published
in Proceedings - International Symposium on Electrets
Pages: 533-536
Conference
10Th International Symposium on Electrets (Ise 10), Date: 22 September 1999 through 24 September 1999, Location: Delphi, Greece, Sponsors: IEEE Dielectrics and Electrical Insulation Society
Indexing
Scopus®
Publication Identifiers
Scopus: 2-s2.0-0033340544
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