Active Protection For Power Mos Transistors.

AuthID
 P-009-2MH
2
Author(s)
Castro Simas, MI
·
Document Type
Proceedings Paper
Year published
1987
Published
in PESC Record - IEEE Annual Power Electronics Specialists Conference, ISSN: 0275-9306
Pages: 69-75
Conference
Pesc 87 Record - 18Th Annual Ieee Power Electronics Specialists Conference., Location: Blacksburg, VA, USA, Sponsors: IEEE, Power Electronics Council, New York, NY, USA
Indexing
Scopus®
Publication Identifiers
Scopus: 2-s2.0-0023211116
Source Identifiers
ISSN: 0275-9306
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