Scaling of Thermoelectric Voltage Induced by Microwave Radiation at the Boundary Between 2D Electron Systems

AuthID
 P-009-F17
9
Author(s)
Hoxha, I
·
Jin, Y
·
Sarachik, MP
·
Caldas, M
·
Studart, N
Document Type
Proceedings Paper
Year published
2009
Published
in AIP Conference Proceedings, ISSN: 0094-243X
Volume: 1199, Pages: 215-216
Conference
29Th International Conference on Physics of Semiconductors, Icps 29, Date: 27 July 2008 through 1 August 2008, Location: Rio de Janeiro, Sponsors: IUPAP;CNPQ;CAPES;FAPESP
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Publication Identifiers
Scopus: 2-s2.0-74849127779
Source Identifiers
ISSN: 0094-243X
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