Analysis of Semiconductor Laser Frequency Noise Taking into Account Multiple Reflections in the External Cavity

AuthID
 P-000-YVK
2
Author(s)
Document Type
Article
Year published
2000
Published
in IEE PROCEEDINGS-OPTOELECTRONICS, ISSN: 1350-2433
Volume: 147, Issue: 5, Pages: 335-344 (10)
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Publication Identifiers
Scopus: 2-s2.0-0034297621
Wos: WOS:000165271000002
Source Identifiers
ISSN: 1350-2433
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