Embedded Measurement System for Non-Destructive Testing Using New Eddy Currents Planar Array Probe

AuthID
 P-00A-3WM
4
Author(s)
Abrantes, R
·
Document Type
Proceedings Paper
Year published
2014
Published
in 2014 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC) PROCEEDINGS
Pages: 583-588 (6)
Conference
Ieee International Instrumentation and Measurement Technology Conference (I2Mtc), Date: MAY 12-15, 2014, Location: Montevideo, URUGUAY, Sponsors: IEEE, IEEE Instrumentat & Measurement Soc
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Publication Identifiers
Wos: WOS:000346477200113
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