Automated Evaluation of Patterned Fabrics for Defects Detection

AuthID
P-001-27V
1
Editor(s)
SanchezMondragon, JJ
Document Type
Proceedings Paper
Year published
2000
Published
in SIXTH INTERNATIONAL CONFERENCE ON EDUCATION AND TRAINING IN OPTICS AND PHOTONICS in PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE), ISSN: 0277-786X
Volume: 3831, Pages: 403-407 (5)
Conference
6Th International Conference on Education and Training in Optics and Photonics, Date: JUL 28-30, 1999, Location: CANCUN, MEXICO, Sponsors: Int Commiss Opt, Opt Soc Amer, SPIE, Univ Autonoma Estado Morelos, Mexico, Univ Guanajuato, Mexico, Acad Mexicana Optica, Secretaria Educ Publica, Consejo Nacl Cienca & Technol, Univ Amer Puebla, Inst Natl Astrofisica, Optica Electronica, Centro Investigaciones Opticas, CICESE, Univ Nacl Autonoma Medixo, Natl Sci Fdn
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Publication Identifiers
Scopus: 2-s2.0-0033685581
Wos: WOS:000088548900053
Source Identifiers
ISSN: 0277-786X
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