Rbs Lattice Site Location and Damage Recovery Studies in Gan

AuthID
 P-001-60X
7
Author(s)
DaSilva, MF
·
Soares, JC
·
Bartels, J
·
Vianden, R
·
Abernathy, CR
·
Pearton, SJ
Document Type
Article
Year published
1999
Published
in MRS INTERNET JOURNAL OF NITRIDE SEMICONDUCTOR RESEARCH, ISSN: 1092-5783
Volume: 4, Issue: SUPPL. 1
Indexing
Wos®
Scopus®
Publication Identifiers
Scopus: 2-s2.0-3442895419
Wos: WOS:000079680200145
Source Identifiers
ISSN: 1092-5783
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

A place for researchers and their institutions

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service