Structural Properties of Ge Nano-Crystals Embedded in Sio2 Films from X-Ray Diffraction and Raman Spectroscopy

AuthID
 P-001-6HB
4
Author(s)
Document Type
Article
Year published
1998
Published
in THIN SOLID FILMS, ISSN: 0040-6090
Volume: 336, Issue: 1-2, Pages: 58-62 (5)
Conference
Symposium on Thin Films Epitaxial Growth and Nanostructures, at the E-Mrs Spring Meeting 1998, Date: JUN 16-19, 1998, Location: STRASBOURG, FRANCE, Sponsors: European MRS
Indexing
Wos®
Scopus®
Crossref®
Google Scholar®
Publication Identifiers
Scopus: 2-s2.0-0032320954
Wos: WOS:000078141900014
Source Identifiers
ISSN: 0040-6090
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

A place for researchers and their institutions

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service