Publications

An Efficient Algorithm for Fast Parasitic Extraction and Passive Order Reduction of 3D Interconnect Models

AuthID
P-001-8YE

Author(s)

Marques, N

Kamon, M

White, J

Silveira, LM

Document Type

Proceedings Paper

Year published

1998

Published

in DESIGN, AUTOMATION AND TEST IN EUROPE, PROCEEDINGS, ISSN: 1530-1591

Pages: 538-543 (6)

Conference

Design, Automation and Test in Europe Conference (Date98), Date: FEB 23-26, 1998, Location: PARIS, FRANCE, Sponsors: European Design & Automat Assoc, Electr Design Automat Consortium, IEEE Comp Soc, Tech Comm Test Technol, Int Federat Informat Proc, Working Grp CAD, European CAD Stand Initiat, ACM, SIGDA, AEIA, ATI, CEPIS, CLCR, CNR, IEEE CS DATC, GI, GMM, HTE, ITG, KVIV, MATE, NIISAPRAN

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