An Efficient Algorithm for Fast Parasitic Extraction and Passive Order Reduction of 3D Interconnect Models

AuthID
 P-001-8YE
4
Author(s)
Marques, N
·
Kamon, M
·
White, J
·
Document Type
Proceedings Paper
Year published
1998
Published
in DESIGN, AUTOMATION AND TEST IN EUROPE, PROCEEDINGS, ISSN: 1530-1591
Pages: 538-543 (6)
Conference
Design, Automation and Test in Europe Conference (Date98), Date: FEB 23-26, 1998, Location: PARIS, FRANCE, Sponsors: European Design & Automat Assoc, Electr Design Automat Consortium, IEEE Comp Soc, Tech Comm Test Technol, Int Federat Informat Proc, Working Grp CAD, European CAD Stand Initiat, ACM, SIGDA, AEIA, ATI, CEPIS, CLCR, CNR, IEEE CS DATC, GI, GMM, HTE, ITG, KVIV, MATE, NIISAPRAN
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Publication Identifiers
Scopus: 2-s2.0-84893769776
Wos: WOS:000072439300081
Source Identifiers
ISSN: 1530-1591
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