Performance Degradation of Microcrystalline Silicon-Based P-I-N Detectors upon He-4 Irradiation

AuthID
P-001-CAT
6
Author(s)
2
Editor(s)
Davies, G; Nazare, MH
Document Type
Article
Year published
1997
Published
in DEFECTS IN SEMICONDUCTORS - ICDS-19, PTS 1-3 in Materials Science Forum, ISSN: 0255-5476
Volume: 258-2, Issue: PART 1, Pages: 593-598 (6)
Conference
19Th International Conference on Defects in Semiconductors (Icds-19), Date: JUL, 1997, Location: AVEIRO, PORTUGAL, Sponsors: European Union DG XII Sci Res & Dev, Fundacao Calouste Gulbenkian, Junta Nacl Investigacio Cient & Tecnol, USA Res Off, Trans Tech Publicat Ltd, USN Off Naval Res Grant
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Publication Identifiers
Scopus: 2-s2.0-0031357829
Wos: WOS:000072749500096
Source Identifiers
ISSN: 0255-5476
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