Study of Defects in Diamond Films by Electrical Measurements

AuthID
P-001-CAV
3
Author(s)
2
Editor(s)
Davies, G; Nazare, MH
Document Type
Article
Year published
1997
Published
in DEFECTS IN SEMICONDUCTORS - ICDS-19, PTS 1-3 in MATERIALS SCIENCE FORUM, ISSN: 0255-5476
Volume: 258-2, Issue: PART 2, Pages: 793-798 (6)
Conference
19Th International Conference on Defects in Semiconductors (Icds-19), Date: JUL, 1997, Location: AVEIRO, PORTUGAL, Sponsors: European Union DG XII Sci Res & Dev, Fundacao Calouste Gulbenkian, Junta Nacl Investigacio Cient & Tecnol, USA Res Off, Trans Tech Publicat Ltd, USN Off Naval Res Grant
Indexing
Publication Identifiers
Scopus: 2-s2.0-3743150640
Wos: WOS:000072749500129
Source Identifiers
ISSN: 0255-5476
Export Publication Metadata
Marked List
Info
At this moment we don't have any links to full text documens.