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High Energy X-Ray Diffraction Analysis of Strain and Residual Stress in Silicon Nitride Ceramic Diffusion Bonds

AuthID
P-00F-RGG

Author(s)

Vila, M

Prieto, C

Miranzo, P

Osendi, MI

Terry, AE

Vaughan, GBM

Editor(s)

Greaves N.Kvick A.

Document Type

Proceedings Paper

Year published

2005

Published

in Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, ISSN: 0168-583X

Volume: 238, Issue: 1-4, Pages: 119-123

Conference

Synchrotron Radiation in Materials Science Proceedings of the 4Th Conference on Synchrotron Radiation in Materials Science, Date: 23 August 2004 through 25 August 2004

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Publication Identifiers

DOI: 10.1016/j.nimb.2005.06.030

Scopus: 2-s2.0-25144439509

Source Identifiers

ISSN: 0168-583X

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High Energy X-Ray Diffraction Analysis of Strain and Residual Stress in Silicon Nitride Ceramic Diffusion Bonds

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High Energy X-Ray Diffraction Analysis of Strain and Residual Stress in Silicon Nitride Ceramic Diffusion Bonds

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