A Method for the In-Circuit Testing of Σδ Modulators

AuthID
 P-00G-Q0S
3
Author(s)
Duarte, JS
·
Document Type
Proceedings Paper
Year published
2001
Published
in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
Pages: 634-637
Conference
11Th Imeko Tc4 Symposium on Trends in Electrical Measurements and Instrumentation and 6Th Imeko Tc4 Workshop on Adc Modelling and Testing 2001, Date: 13 September 2001 through 14 September 2001
Indexing
Scopus®
Publication Identifiers
Scopus: 2-s2.0-84943339831
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

A place for researchers and their institutions

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service