Bist For 1149.1-Compatible Boards - A Low-Cost And Maximum-Flexibility Solution

AuthID
P-001-NN0
1
Editor(s)
Anon
Document Type
Proceedings Paper
Year published
1993
Published
in INTERNATIONAL TEST CONFERENCE 1993 PROCEEDINGS: DESIGNING, TESTING, AND DIAGNOSTICS - JOIN THEM
Pages: 536-543 (8)
Conference
International Test Conference 1993: Designing, Testing, and Diagnostics - Join Them, Date: OCT 17-21, 1993, Location: BALTIMORE, MD, Sponsors: IEEE, COMP SOC, TEST TECHNOL TECH COMM, IEEE, PHILADELPHIA SECT
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Publication Identifiers
Dblp: conf/itc/FerreiraGRA93
Scopus: 2-s2.0-0027869245
Wos: WOS:A1993BZ61X00069
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