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Detection of Illegitimate Access to Jtag via Statistical Learning in Chip
AuthID
P-00G-TRY
P-00G-TRY
3
Author(s)
Document Type
Proceedings Paper
Year published
2015
Published
in 2015 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE) in Design Automation and Test in Europe Conference and Exhibition, ISSN: 1530-1591
Volume: 2015-April, Pages: 109-114 (6)
Conference
Conference on Design Automation Test in Europe (Date), Date: MAR 09-13, 2015, Location: Alpexpo Congress Center, Grenoble, FRANCE, Sponsors: European Design & Automation Association, Elect Design Automation Consortium, IEEE Council on Elec Design Automation, European Elect Chips & Syst design Initiative, ACM Special Interest Grp on Design Automation, Russian Acad of Sciences, IEEE Comp Soc test technology tech Council (tttC), IEEE Solid-State Circuits Soc (SSCS), International Federation for Information Processing (IFIP), Ville De Grenoble, LETI, ST, MINALOGIC, Agence DEtudes et de Promotion de lIsere, Rhone Alpes, Grenoble Alpes, CMP, Systematic Paris Region Systems & ICT, Cluster SCC, JEITA, Synopsys, Mentor Graphics, Cadence, MathWorks, EUROTRAINING, Host: Alpexpo Congress Center
Publication Identifiers
Scopus: 2-s2.0-84945900957
Wos: WOS:000380393200019
Source Identifiers
ISSN: 1530-1591
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