On the Growth and Physical-Chemical Characterization of Tb5Si2Ge2 Thin Films Produced by Electron-Beam Evaporation

AuthID
P-00G-X0F
Document Type
Proceedings Paper
Year published
2015
Published
in MATERIALS TODAY-PROCEEDINGS, ISSN: 2214-7853
Volume: 2, Issue: 1, Pages: 26-32 (7)
Conference
5Th International Conference on Advanced Nanomaterials (Anm), Date: JUL 02-04, 2014, Location: Aveiro, PORTUGAL
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Publication Identifiers
Scopus: 2-s2.0-84947753170
Wos: WOS:000358001500005
Source Identifiers
ISSN: 2214-7853
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